The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Aug. 19, 2019
Applicant:

Endress+hauser Se+co. KG, Maulburg, DE;

Inventors:

Ghislain Daufeld, Village Neuf, FR;

Stefan Gorenflo, Hausen, DE;

Alexey Malinovskiy, Maulburg, DE;

Jens Merle, Schopfheim, DE;

Markus Vogel, Schopfheim, DE;

Assignee:

Endress+Hauser SE+Co. KG, Maulburg, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01F 23/284 (2006.01);
U.S. Cl.
CPC ...
G01F 23/284 (2013.01);
Abstract

Disclosed is a method for a radar-based fill level measurement according to the pulse transit time method. Also disclosed a fill level measuring device for carrying out said method. On the basis of an evaluation signal, the relation between the clock rate and the sampling rate, and a predefined target relation, an evaluation curve is generated. The fill level is thereby determined on the basis of said evaluation curve. The evaluation curve is generated by means of temporal expansion or compression of the evaluation signal, wherein the compression or the expansion is carried out as a function of a ratio between the measured relation and the target relation. Any deviation of the sampling rate from the setpoint value of the sampling rate, for example due to faulty control, is compensated. Thus, the potentially attainable accuracy of the fill level measurement is increased due to the invention.


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