The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2024
Filed:
Feb. 14, 2019
Nec Corporation, Tokyo, JP;
Masatake Takahashi, Tokyo, JP;
Shin Tominaga, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
A facility state analyzing device includes: a measurement unit that measures a load on a facility and generates, based on a measurement condition, load information representing the load being measured; an extraction unit that extracts, from the load information generated by the measurement unit, dynamic load information representing a dynamic component of the load whose dynamic fluctuation degree with a lapse of time is equal to or more than a reference; a measurement condition determination unit that determines, based on temporal transition of the dynamic load information, the measurement condition indicating a time zone during which the load information is generated; and an analysis unit that analyzes the load applied on the facility, by using the load information generated based on the measurement condition, to efficiently increase accuracy in estimating the state of the facility on the basis of a situation of the load applied to the facility.