The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Apr. 01, 2023
Applicant:

Matrix Sensors, Inc., San Diego, CA (US);

Inventors:

David K Britt, El Cerrito, CA (US);

Paul R Wilkinson, El Segundo, CA (US);

Steven Yamamoto, San Diego, CA (US);

Assignee:

Matrix Sensors, Inc, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 28/04 (2006.01); C07F 9/00 (2006.01); C07F 15/04 (2006.01); C08J 5/18 (2006.01); C30B 29/58 (2006.01); G01G 3/16 (2006.01);
U.S. Cl.
CPC ...
C30B 28/04 (2013.01); C07F 9/00 (2013.01); C07F 15/04 (2013.01); C08J 5/18 (2013.01); C30B 29/58 (2013.01); G01G 3/165 (2013.01);
Abstract

An apparatus and method is provided for coating a surface of a material with a film of porous coordination polymer. A first substrate having a first surface to be coated is positioned in a processing chamber such that the first surface is placed in a substantially opposing relationship to a second surface. In some embodiments, the second surface is provided by a wall of the processing chamber, and in other embodiments the second surface is provided by a second substrate to be coated. The first substrate is held such that a gap exists between the first and second surfaces, and the gap is filled with at least one reaction mixture comprising reagents sufficient to form the crystalline film on at least the first surface. A thin gap (e.g., having a thickness less than 2 mm) between the first and second surfaces is effective for producing a high quality film having a thickness less than 100 μm. Confining the volume of the reaction mixture to a thin layer adjacent the substrate surface significantly reduces problems with sedimentation and concentration control. In some embodiments, the size, shape, or average thickness of the gap is adjusted during formation of the film in response to feedback from at least one film growth monitor.


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