The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2024
Filed:
Mar. 31, 2021
Applicant:
Canon Medical Systems Corporation, Otawara, JP;
Inventors:
Xiaohui Zhan, Vernon Hills, IL (US);
Xiaofeng Niu, Vernon Hills, IL (US);
Assignee:
CANON MEDICAL SYSTEMS CORPORATION, Otawara, JP;
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01); A61B 6/42 (2024.01); A61B 6/58 (2024.01);
U.S. Cl.
CPC ...
A61B 6/583 (2013.01); A61B 6/032 (2013.01); A61B 6/4241 (2013.01);
Abstract
A method and a system for providing calibration for a photon counting CT detector forward model for material decomposition. Various slabs of predetermined material and path lengths are placed in the photon counting CT detector and scanned using one or more stationary X-rays to obtain calibration data and parametrize the forward model.
Zhan, Xiaohui. (2024). Material decomposition calibration method and apparatus for a full size photon counting ct system (U.S. Patent No. 11944484). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11944484
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile