The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Aug. 06, 2020
Applicants:

Université Grenoble Alpes, Saint-Martin-d'Hères, FR;

Surgiqual Institute, Meylan, FR;

Centre Hospitalier Universitaire Grenoble Alpes, La Tronche, FR;

Institut Polytechnique DE Grenoble, Grenoble, FR;

Centre National DE LA Recherche Scientifique, Paris, FR;

Université Claude Bernard Lyon 1, Villeurbanne, FR;

École Centrale DE Lyon, Ecully, FR;

Cpe Lyon Formation Continue ET Recherche, Villeurbanne, FR;

Inventors:

Yannick Grondin, Arbin, FR;

Philippe Cinquin, Saint-Nazaire-lès-Eymes, FR;

Laurent Desbat, Grenoble, FR;

Pierrick Guiral, Lyons, FR;

Patrick Pittet, Fontaines-Saint-Martin, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/06 (2006.01); A61B 6/40 (2024.01);
U.S. Cl.
CPC ...
A61B 6/06 (2013.01); A61B 6/40 (2013.01);
Abstract

Collimation device for an X-ray detection system, the collimation device comprising: a collimator comprising a substantially planar support made of a material with partial or zero radiotransparency, the support being rotatably movable about an axis of rotation (Δ) which passes through the support and which is perpendicular to a first face of the support which acts as an X-ray plane of incidence referred to as the main plane of the support (P), the support (D) being provided on the first face with a slit which is completely transparent to X-rays and which is configured to generate an X-ray flow when the collimator is exposed to an X-ray source, the slit extending longitudinally in the main plane of the support along an axis located at a non-zero distance (d) from the axis of rotation (Δ), the slit extending through the entire thickness of the support.


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