The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

Apr. 06, 2018
Applicant:

Keysight Technologies, Inc., Minneapolis, MN (US);

Inventor:

Stephen Lee McGregory, Austin, TX (US);

Assignee:

KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 9/00 (2022.01); H04L 9/40 (2022.01); H04L 41/14 (2022.01); H04L 43/08 (2022.01); H04L 43/50 (2022.01); H04L 61/4511 (2022.01); H04L 67/02 (2022.01);
U.S. Cl.
CPC ...
H04L 63/1433 (2013.01); H04L 41/145 (2013.01); H04L 43/08 (2013.01); H04L 43/50 (2013.01); H04L 61/4511 (2022.05); G06F 2221/034 (2013.01); H04L 67/02 (2013.01);
Abstract

Methods, systems, and computer readable media for network security testing using at least one emulated server are disclosed. According to one example method, the method comprises: receiving, from a client device and at an emulated domain name service (DNS) server, a DNS request requesting an Internet protocol (IP) address associated with a domain name; sending, to the client device and from the emulated DNS server, a DNS response including an IP address associated with an emulated server; receiving, from the client device and at the emulated server, a service request using the IP address; sending, to the client device and from the emulated server, a service response including at least one attack vector data portion; and determining, by a test controller and using data obtained by at least one test related entity, a performance metric associated with a system under test (SUT).


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