The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2024
Filed:
Aug. 31, 2023
Conviva Inc., Foster City, CA (US);
Henry Milner, Burlingame, CA (US);
Oleg Puzyrko, San Mateo, CA (US);
Jibin Zhan, San Mateo, CA (US);
Hui Zhang, Burlingame, CA (US);
Akara Sucharitakul, Foster City, CA (US);
Vyas Sekar, Foster City, CA (US);
Yihua Cheng, Chicago, IL (US);
Conviva Inc., Foster City, CA (US);
Abstract
Determining a time-state metric includes receiving a stream of raw data values of an attribute. Each received raw data value of the attribute is associated with a timestamp. It further includes converting the received stream of raw data values into a timeline representation of the attribute over time. The timeline representation comprises a sequence of spans. A span comprises a span start time, a span end time, and a span value. The span value comprises an encoding of one or more values of the attribute over a time interval determined by the span start time and the span end time. It further includes determining a time-state metric according to a timeline request configuration. The timeline request configuration comprises one or more timeline operations. The time-state metric is computed at least in part by performing a timeline operation on the timeline representation of the attribute.