The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

Mar. 18, 2021
Applicants:

Shayan Shahramian, Richmond Hill, CA;

Ryan Douglas Bespalko, Toronto, CA;

Inventors:

Shayan Shahramian, Richmond Hill, CA;

Ryan Douglas Bespalko, Toronto, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/16 (2006.01);
U.S. Cl.
CPC ...
H04B 1/1607 (2013.01);
Abstract

Methods and apparatuses for calibrating voltage offset of receiver data samplers in mission mode are described. The operating conditions, including the sampling threshold, of a first sampler are matched with those of a second sampler by adjusting the voltage offset of the second sampler. The voltage offset of the first sampler is adjusted in a first voltage direction until an error rate between the two samplers meets a threshold error value at a first threshold voltage offset value. The voltage offset of the first sampler is further adjusted in a second voltage direction, opposite of the first voltage direction, until the error rate between the two samplers meets the threshold error value at a second threshold voltage offset value. The voltage offset of the first sampler is adjusted to be an average value between the first threshold voltage offset value and the second threshold voltage offset value.


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