The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

Apr. 23, 2020
Applicant:

Eaton Intelligent Power Limited, Dublin, IE;

Inventors:

Werner Dichler, Grossschoenau, AT;

Guenter Martinek, Vienna, AT;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/52 (2020.01); G01R 31/14 (2006.01); H02H 1/00 (2006.01);
U.S. Cl.
CPC ...
H02H 1/0015 (2013.01); G01R 31/14 (2013.01); G01R 31/52 (2020.01);
Abstract

An arc fault detector includes slew-rate-detection, envelope-step-detection, and first and second controller units. The slew-rate-detection-unit determines a slew rate of the electric current in the first electric line, comparing the slew rate with a threshold, and outputting a slew-rate-detection-signal on a second output when the determined slew rate is higher than the threshold. The envelope-step-detection-unit determines change of an envelope-value of a predefined frequency band of the broadband measurement signal within a predefined timespan, and outputs an envelope-step-detection-signal on a third output when the change is higher than a threshold change. The first controller-unit, connected to second and third outputs, outputs a second arc-detection-signal on a fourth output when it receives slew-rate and frequency-detection signals within a first detection-window. The second controller-unit, connected to first and fourth outputs, outputs a trigger signal when it receives first and second arc-detection-signals for at least a defined total time within a second detection-window.


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