The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

May. 03, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Lan Yu, Voorheesville, NY (US);

Andrew M. Greene, Slingerlands, NY (US);

Wenyu Xu, Albany, NY (US);

Heng Wu, Guilderland, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/786 (2006.01); H01L 29/06 (2006.01); H01L 29/417 (2006.01); H01L 29/423 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 29/78696 (2013.01); H01L 29/0665 (2013.01); H01L 29/41775 (2013.01); H01L 29/42392 (2013.01); H01L 29/66545 (2013.01);
Abstract

A semiconductor nanosheet device including semiconductor channel layers vertically aligned and stacked one on top of another, separated by a work function metal, and a second layer between two first layers, the second layer and two first layers between the semiconductor channel layers and a substrate. A semiconductor device including a lower first layer, a second layer, and a source drain region between a first set of semiconductor channel layers vertically aligned and stacked one on top of another, and a second set of semiconductor channel layers. A method including forming a stack sacrificial layer, a stack of nanosheet layers, forming a cavity by removing the stack sacrificial layer, and simultaneously forming a first layer on an upper surface of the stack sacrificial layer, on vertical side surfaces of the set of sacrificial gates, and an upper first layer and a lower first layer in a portion of the cavity.


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