The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

May. 31, 2018
Applicant:

Eugenus, Inc., San Jose, CA (US);

Inventors:

Vinayak Veer Vats, San Ramon, CA (US);

M. Ziaul Karim, San Jose, CA (US);

Bo Seon Choi, Yongin-si, KR;

Somilkumar J. Rathi, San Jose, CA (US);

Niloy Mukherjee, San Ramon, CA (US);

Assignee:

Eugenus, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/42 (2006.01); C23C 16/34 (2006.01); C23C 16/455 (2006.01); C23C 28/00 (2006.01); H01L 21/02 (2006.01); H01L 21/285 (2006.01); H01L 21/768 (2006.01); H01L 23/532 (2006.01);
U.S. Cl.
CPC ...
H01L 21/7685 (2013.01); C23C 16/34 (2013.01); C23C 16/345 (2013.01); C23C 16/42 (2013.01); C23C 16/45527 (2013.01); C23C 16/45529 (2013.01); C23C 28/00 (2013.01); C23C 28/321 (2013.01); C23C 28/34 (2013.01); C23C 28/345 (2013.01); C23C 28/36 (2013.01); H01L 21/02068 (2013.01); H01L 21/28518 (2013.01); H01L 21/28562 (2013.01); H01L 21/76841 (2013.01); H01L 23/53266 (2013.01); H01L 21/76846 (2013.01);
Abstract

The disclosed technology generally relates to semiconductor structures and their fabrication, and more particularly to diffusion barrier structures containing Ti, Si, N and methods of forming same. A method of forming an electrically conductive diffusion barrier comprises providing a substrate in a reaction chamber and forming a titanium silicide (TiSi) region on the substrate by alternatingly exposing the substrate to a titanium-containing precursor and a first silicon-containing precursor. The method additionally comprises forming a titanium silicon nitride (TiSiN) region on the TiSi region by alternatingly exposing the substrate to a titanium-containing precursor, a nitrogen-containing precursor and a second silicon-containing precursor. The method can optionally include, prior to forming the TiSi region, forming a titanium nitride (TiN) region by alternatingly exposing the substrate to a titanium-containing precursor and a nitrogen-containing precursor.


Find Patent Forward Citations

Loading…