The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

Dec. 06, 2019
Applicant:

Scienta Omicron Ab, Uppsala, SE;

Inventors:

Peter Amann, Åkersberga, SE;

Anders Nilsson, Stockholm, SE;

Assignee:

Scienta Omicron AB, Uppsala, SE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/06 (2006.01); H01J 37/08 (2006.01);
U.S. Cl.
CPC ...
H01J 49/067 (2013.01); H01J 37/08 (2013.01); H01J 2237/006 (2013.01); H01J 2237/188 (2013.01); H01J 2237/2855 (2013.01);
Abstract

An aperture device () is described, which is attachable to a lens system (). The lens system () is arranged to form a particle beam of charged particles, emitted from a sample surface (Ss). The aperture device () comprises an end surface (S) which is to be arranged facing the sample surface (Ss), at least one aperture () arranged in the end surface (S), a length axis () which extends through the centre of said at least one aperture (), and at least one gas outlet (), which is arranged at a transverse distance (T) perpendicular from the length axis (), and is arranged to direct gas into a volume between at least one aperture () and the sample surface (Ss). The end surface (S) within a distance, equal to ⅓ of the transverse distance (T), perpendicular from the length axis () has a variation along the length axis () being smaller than ⅙ of the transverse distance (T).


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