The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2024
Filed:
May. 08, 2019
Shimadzu Corporation, Kyoto, JP;
Yusuke Tagawa, Kyoto, JP;
Yuki Ishikawa, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
A mass spectrometer according to an aspect of the present invention includes, to optimize N (where N is an integer of 2 or more) parameters that affect ionization efficiency in an ion source (), a measurement controller () that causes respective units to repeatedly execute measurement on a sample containing a target component while changing values of the N parameters or a value set of M (where M is an integer smaller than N) parameters, in a plurality of stages, and a parameter determiner () that sequentially finds an optimum value for each parameter based on a result of the measurement executed under control of the measurement controller (). At least one parameter whose physical quantity is temperature is optimized prior to all of the parameters whose physical quantities are other than temperature.