The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

Apr. 18, 2023
Applicant:

Memorial Sloan Kettering Cancer Center, New York, NY (US);

Inventors:

Andrew Schaumberg, New York, NY (US);

Thomas Fuchs, New York, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06V 10/25 (2022.01); G06V 10/44 (2022.01); G06V 10/46 (2022.01); G06V 10/50 (2022.01); G06V 10/82 (2022.01); G06V 20/69 (2022.01); G06V 30/24 (2022.01);
U.S. Cl.
CPC ...
G06V 20/693 (2022.01); G06V 10/25 (2022.01); G06V 10/454 (2022.01); G06V 10/462 (2022.01); G06V 10/507 (2022.01); G06V 10/82 (2022.01); G06V 20/69 (2022.01); G06V 20/695 (2022.01); G06V 20/698 (2022.01); G06V 30/2504 (2022.01);
Abstract

The present application relates generally to identifying regions of interest in images, including but not limited to whole slide image region of interest identification, prioritization, de-duplication, and normalization via interpretable rules, nuclear region counting, point set registration, and histogram specification color normalization. This disclosure describes systems and methods for analyzing and extracting regions of interest from images, for example biomedical images depicting a tissue sample from biopsy or ectomy. Techniques directed to quality control estimation, granular classification, and coarse classification of regions of biomedical images are described herein. Using the described techniques, patches of images corresponding to regions of interest can be extracted and analyzed individually or in parallel to determine pixels correspond to features of interest and pixels that do not. Patches that do not include features of interest, or include disqualifying features, can be disqualified from further analysis. Relevant patches can analyzed and stored with various feature parameters.


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