The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

Dec. 19, 2019
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Atsutake Kosuge, Tokyo, JP;

Takashi Oshima, Tokyo, JP;

Yukinori Akamine, Tokyo, JP;

Keisuke Yamamoto, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); B25J 13/08 (2006.01); G06T 7/73 (2017.01); G06V 20/64 (2022.01);
U.S. Cl.
CPC ...
G06V 20/653 (2022.01); B25J 13/089 (2013.01); G06T 7/75 (2017.01);
Abstract

A three-dimensional position and posture recognition device speeds estimation of a position posture and a gripping coordinate posture of a gripping target product. The device includes: a sensor unit configured to measure a distance between an image of an object and the object; and a processing unit configured to calculate an object type included in the image, read model data of each object from the external memory, and create structured model data having a resolution set for each object from the model data, generate measurement point cloud data of a plurality of resolutions from information on a distance between an image of the object and the object, perform a K neighborhood point search using the structured model data and the measurement point cloud data, and perform three-dimensional position recognition processing of the object by rotation and translation estimation regarding a point obtained from the K neighborhood point search.


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