The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

Jul. 29, 2020
Applicant:

Raytheon Company, Tewksbury, MA (US);

Inventors:

Kalen K. Omo, Waipahu, HI (US);

Derek J. Van Damme, Tucson, AZ (US);

Dmitry A. Lyapustin, Tucson, AZ (US);

Hillary Aigbe Omoigui, Jr., Tucson, AZ (US);

Rondell J. Wilson, Vail, AZ (US);

Assignee:

Raytheon Company, Tewksbury, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 30/20 (2020.01); G06F 119/02 (2020.01);
U.S. Cl.
CPC ...
G06F 30/20 (2020.01); G06F 2119/02 (2020.01);
Abstract

Discussed herein are devices, systems, and methods for determining whether to conduct a mission. A method can include partitioning, by processing circuitry configured to implement a model for determining a value representing a probability that operation of an electronic part of a device will be upset by a single event effect (SEE), a trajectory of the device into disjoint time segments. The method can include determining, based on an effective shielding of the device and one or more flux lookup tables (LUTs) for each of the time segments, respective SEE rates experienced by the electronic part for each time segment. The method can include determining, based on the determined respective SEE rates and using the model, the probability. The method can include permitting the device to traverse the trajectory only if the determined probability is less than a specified threshold.


Find Patent Forward Citations

Omo, Kalen. (2024). Modeling natural space environment effects on hardware (U.S. Patent No. 11941330). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11941330

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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