The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

Nov. 11, 2021
Applicant:

Google Llc, Mountain View, CA (US);

Inventors:

Kihyuk Sohn, Mountain View, CA (US);

Chun-Liang Li, Mountain View, CA (US);

Jinsung Yoon, San Jose, CA (US);

Tomas Jon Pfister, Foster City, CA (US);

Assignee:

Google LLC, Mountain View, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/214 (2023.01); G06N 3/08 (2023.01); G06V 10/22 (2022.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06F 18/2155 (2023.01); G06N 3/08 (2013.01); G06V 10/22 (2022.01);
Abstract

A method for training a machine learning model includes obtaining a set of training samples. For each training sample in the set of training samples, during each of one or more training iterations, the method includes cropping the training sample to generate a first cropped image, cropping the training sample to generate a second cropped image that is different than the first cropped image, and duplicating a first portion of the second cropped image. The method also includes overlaying the duplicated first portion of the second cropped image on a second portion of the second cropped image to form an augmented second cropped image. The first portion is different than the second portion. The method also includes training the machine learning model with the first cropped image and the augmented second cropped image.


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