The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

Jun. 16, 2017
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Sharatkumar Nagesh Kuppahally, Bellevue, WA (US);

Ravi Math, Redmond, WA (US);

Adam Douglas Morley, Seattle, WA (US);

Ming-chuan Wu, Bellevue, WA (US);

Wei Xiao, Bellevue, WA (US);

Rajaprabhu Thiruchi Loganathan, Issaquah, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/23 (2019.01); G06F 16/245 (2019.01); G06F 16/27 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2379 (2019.01); G06F 16/245 (2019.01); G06F 16/27 (2019.01);
Abstract

Consistent queries to replicated data may be performed according to global clock values. Time values for updates performed at a data set may be identified according to a global clock. The updates may be replicated to a replicated portion of a data set. Queries directed to the replicated portion of the data set may be performed in response to determining that the time values for updates indicate that the replicated portion of the data set is consistent with a time value identified for the query according to the global clock.


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