The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

Oct. 04, 2019
Applicant:

Sang Su Choi, Seongnam-si, KR;

Inventor:

Sang Su Choi, Seongnam-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G06Q 10/00 (2023.01); G06Q 10/06 (2023.01); G06Q 10/0633 (2023.01); G06Q 10/067 (2023.01); G06Q 10/20 (2023.01); G06Q 50/04 (2012.01); G06T 7/00 (2017.01); G07C 3/00 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41885 (2013.01); G06Q 10/0633 (2013.01); G06Q 10/067 (2013.01); G06Q 10/20 (2013.01); G06Q 50/04 (2013.01); G06T 7/0004 (2013.01); G07C 3/005 (2013.01); G05B 2219/32339 (2013.01); G05B 2219/32347 (2013.01); G06T 2207/30164 (2013.01);
Abstract

A computing system for building a virtual factory includes database and a virtual factory building module. The database stores modeling data. The virtual factory building module builds the virtual factory in which a progress situation of a work performed from a first portion to a second portion is displayed, based on the modeling data and a time difference between an output time of a first signal and an output time of a second signal, which is calculated based on the first signal output when a product is at a first portion on one or more facilities monitored from a first location present in an outside of the one or more facilities used in a real factory and the second signal output when the product is at a second portion on the one or more facilities monitored from a second location present in the outside of the one or more facilities. The first location is spaced from the second location, and the first portion is spaced from the second portion.


Find Patent Forward Citations

Choi, Sang. (2024). Computing system for analyzing factory and method of using the computing system to manage factory (U.S. Patent No. 11940783). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11940783

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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