The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

Jul. 07, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Woohyun Son, Suwon-si, KR;

Kiseok Bae, Hwaseong-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/333 (2020.01); G01R 31/317 (2006.01); G01R 31/3185 (2006.01); G01R 31/3193 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318597 (2013.01); G01R 31/31719 (2013.01); G01R 31/31727 (2013.01); G01R 31/31935 (2013.01);
Abstract

A system on chip includes a one-time programmable (OTP) memory configured to store secure data, an OTP controller including at least one shadow register configured to read the secure data from the OTP memory and to store the secure data, a power management unit configured to receive an operation mode signal from an external device and to output test mode information indicating whether an operation mode is a test mode according to the operation mode signal and a test valid signal corresponding to the secure data, and a test circuit configured to receive the test mode information from the power management unit, to receive test data from the external device, and to output a scan mode signal and a test mode signal according to the test data and a test deactivation signal, wherein the test deactivation signal corresponds to development state data indicating a chip development state in the secure data.


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