The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

Dec. 15, 2021
Applicant:

Fu Tai Hua Industry (Shenzhen) Co., Ltd., Shenzhen, CN;

Inventors:

Liu-Bin Hu, Shenzhen, CN;

Wei Yang, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G06T 7/00 (2017.01); G01N 21/89 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01N 21/8803 (2013.01); G06T 7/0004 (2013.01); G01N 2021/8841 (2013.01); G01N 2021/8918 (2013.01);
Abstract

A device to detect and analyze defects in magnified scale images of a surface of a finished product illuminated with a blue light source and viewed by multiple image-capturing devices each focused on their own spot includes a supporting mechanism, a transmitting mechanism, a detecting mechanism, and a processor. The transmitting mechanism carries and transmits the product. The detecting mechanism includes a detecting frame, a blue light source assembly. The processor is used to connect to a camera assembly, and preprocess the image of the front of the product to obtain a detection and analysis of any defects of the front of the product.


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