The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2024
Filed:
Jul. 08, 2019
Skyverse Technology Co., Ltd., Guangdong, CN;
Lu Chen, Shenzhen, CN;
Youwei Huang, Beijing, CN;
Gaozeng Cui, Beijing, CN;
Timmy Wang, Beijing, CN;
Skyverse Technology Co., Ltd., Shenzhen, CN;
Abstract
The present invention provides a detection device and a detection method. The detection device uses the signal light formed by the interference of the first and the second echo lights reflected on the surface of the component to be detected to obtain the first light intensity distribution information of the signal light corresponding to the sampling position on the component to be detected by the first detection device to obtain the phase distribution of the signal light according to the intensity distribution to obtain the defect distribution data of the component to be detected. Among them, the first detection apparatus includes more than two polarization detectors, or a non-polarization detector and at least one polarization detector. The present invention can effectively achieve the polarization state analysis of the signal light, achieve the high-precision detection of the component to be detected in the longitudinal direction, and have advantages of good reliability, high stability and fast detection speed.