The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

Aug. 30, 2021
Applicant:

Leica Mikrosysteme Gmbh, Vienna, AT;

Inventors:

Rainer Wogritsch, Vienna, AT;

Paul Wurzinger, Deutsch-Wagram, AT;

Joose Kreutzer, Tampere, FI;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/42 (2006.01); F25D 3/10 (2006.01); C12M 1/00 (2006.01);
U.S. Cl.
CPC ...
G01N 1/42 (2013.01); F25D 3/10 (2013.01); C12M 41/14 (2013.01); F25D 2400/30 (2013.01);
Abstract

A method including one or more steps of a procedure for preparing a microscopic sample for a high-pressure freezing process is provided, wherein the sample is provided using an arrangement comprising a middle plate of a high-pressure freezing cartridge and an incubation chamber, wherein the middle plate is attached to a lower surface of a bottom of the incubation chamber by an adhesive and detachable from the incubation chamber by effecting a relative movement between the middle plate and the incubation chamber, wherein the sample is provided on an enclosing element which is fitted into an opening of the middle plate, and wherein, when the sample is to be subjected to the high-pressure freezing process, the relative movement between the middle plate and the incubation chamber is effected, thereby detaching the middle plate with the sample from the incubation chamber. Means to implement the method are also part of the present disclosure.


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