The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

Feb. 18, 2022
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Ayako Kobayashi, Nagano, JP;

Yuka Kobayashi, Nagano, JP;

Yasuo Koyauchi, Nagano, JP;

Marina Mineno, Nagano, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/50 (2006.01); G01J 3/02 (2006.01); G01J 3/46 (2006.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
G01J 3/50 (2013.01); G01J 3/0264 (2013.01); G01J 3/027 (2013.01); G01J 3/0291 (2013.01); G01J 3/46 (2013.01); G01J 3/462 (2013.01); G01J 3/463 (2013.01); G01J 2003/467 (2013.01); H04N 1/00018 (2013.01); H04N 1/00023 (2013.01); H04N 1/00034 (2013.01);
Abstract

A color measuring system includes a receiving section configured to receive designation of a color group including a plurality of colors, a determining section configured to determine whether a color measured by the color measuring section and a comparison target color in the color group coincide, and a control section configured to, when it is determined that the measured color and the comparison target color coincide, automatically advance a color measuring process to a color measuring process for performing the color measurement for a next color in the color group.


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