The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2024
Filed:
May. 07, 2019
Valeo Schalter Und Sensoren Gmbh, Bietigheim-Bissingen, DE;
Ekkehart Froehlich, Bietigheim-Bissingen, DE;
David Nemere, Bietigheim-Bissingen, DE;
VALEO SCHALTER UND SENSOREN GMBH, Bietigheim-Bissingen, DE;
Abstract
The invention relates to a magnet assembly () for a sensor device for detecting a measurement variable characterizing a rotation state of a steering shaft of a motor vehicle, to a sensor device and to a motor vehicle, wherein the magnet assembly () has a sleeve () and a magnetic element (), which is connected in a form-fitting manner to the sleeve (), wherein the sleeve () is designed for connecting the magnet assembly () to a first part of the steering shaft and has at least one stop flange (C), which extends outwards in the radial direction in a radial plane, for axially securing the magnetic element () in a first axial direction (A), wherein the magnetic element () is arranged concentrically with respect to the sleeve () and, with its first end side (S), is at least partially supported axially on the stop flange (C) and is thereby secured in the first axial direction (A). Furthermore, the magnetic element () is secured in the second axial direction (A) and in the first circumferential direction (U) and in the second circumferential direction (U) by means of at least one latching means (D) engaging in a recess (B) which is open in the axial direction (A) and has a plurality of inner surfaces (I, I, I).
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile