The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

Sep. 23, 2020
Applicant:

Ichikawa Co., Ltd., Tokyo, JP;

Inventors:

Yasuyuki Ogiwara, Bunkyo-ku, JP;

Yuto Muraoka, Bunkyo-ku, JP;

Assignee:

Ichikawa Co., Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D21F 7/10 (2006.01); B29C 65/00 (2006.01); D06H 5/00 (2006.01);
U.S. Cl.
CPC ...
D21F 7/10 (2013.01); B29C 66/1122 (2013.01); B29C 66/4324 (2013.01); B29C 66/4329 (2013.01); B29C 66/729 (2013.01); D06H 5/005 (2013.01);
Abstract

A papermaking felt includes at least one base fabric composed of a MD yam material in the felt running direction (MD) and a CD yarn material in the felt crossing direction (CD) and having MD end regions and CD end regions, at least one of the MD end regions and the CD end regions are overlapped with each other, the entire overlapped portion is welded without removing a part or all of the MD yarn material or the CD yarn material in the overlapped portion, and when the average thickness of the welded portion of each base fabric is x (mm) and the average thickness of the material portion of each base fabric is y (mm), the relationship between x and y of the at least one base fabric satisfies the following formula (1):0.5≤≤0.95.


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