The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

Nov. 23, 2021
Applicant:

Toto Ltd., Kitakyushu, JP;

Inventors:

Yasutaka Nitta, Kitakyushu, JP;

Takuma Wada, Kitakyushu, JP;

Assignee:

TOTO LTD., Kitakyushu, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C23C 24/04 (2006.01); H01J 37/32 (2006.01); C23C 16/44 (2006.01); H01L 21/687 (2006.01);
U.S. Cl.
CPC ...
C23C 24/04 (2013.01); H01J 37/321 (2013.01); H01J 37/32477 (2013.01); H01J 37/32715 (2013.01); C23C 16/4404 (2013.01); H01J 2237/2007 (2013.01); H01J 2237/3341 (2013.01); H01L 21/68757 (2013.01);
Abstract

A method of making a semiconductor manufacturing apparatus member includes a step of preparing an aluminum base having an alumite layer having a porous columnar structure at an upper surface thereof. The alumite layer is an anodic oxidation film, and a Young's modulus of the alumite layer is between 90 GPa and 120 GPa. The method also includes a step of forming a particle-resistant layer on the alumite layer by aerosol deposition, in which an aerosol containing fine particles of a brittle material dispersed in a gas is ejected from a nozzle to impact against a surface of the alumite layer, wherein the particle-resistant layer includes a polycrystalline ceramic; and wherein, when the resulting semiconductor manufacturing apparatus member is exposed to a plasma in a reference plasma resistance test, the particle-resistant layer has an arithmetic average height Sa of 0.060 or less after the reference plasma test is completed.


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