The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

May. 02, 2023
Applicant:

Graymatter Robotics Inc., Los Angeles, CA (US);

Inventors:

Avadhoot Ahire, Los Angeles, CA (US);

YiWei Chen, Los Angeles, CA (US);

Rishav Guha, Los Angeles, CA (US);

Satyandra K. Gupta, Los Angeles, CA (US);

Ariyan M. Kabir, Los Angeles, CA (US);

Ashish Kulkarni, Los Angeles, CA (US);

Caesar Navarro, Los Angeles, CA (US);

Sagar Panchal, Los Angeles, CA (US);

Brual C. Shah, Los Angeles, CA (US);

Assignee:

GrayMatter Robotics Inc., Los Angeles, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B25J 11/00 (2006.01); B24B 51/00 (2006.01); B25J 9/16 (2006.01); B25J 13/08 (2006.01); G06T 1/00 (2006.01); G06T 7/13 (2017.01); G06T 7/60 (2017.01); G06T 19/00 (2011.01);
U.S. Cl.
CPC ...
B25J 9/1653 (2013.01); B24B 51/00 (2013.01); B25J 9/163 (2013.01); B25J 9/1664 (2013.01); B25J 9/1679 (2013.01); B25J 9/1697 (2013.01); B25J 11/0065 (2013.01); B25J 13/085 (2013.01); G06T 1/0014 (2013.01); G06T 7/13 (2017.01); G06T 7/60 (2013.01); G06T 19/00 (2013.01); G06T 2207/10024 (2013.01); G06T 2219/004 (2013.01);
Abstract

A method includes: compiling lower-resolution images, captured during a global scan cycle executed over a workpiece, into a virtual model; defining a nominal toolpath and a nominal target force for the workpiece based on a the virtual model; detecting a defect indicator on the workpiece based on the lower-resolution images; accessing a higher-resolution image captured during a local scan cycle over the defect indicator; characterizing the defect indicator as a defect reparable via material removal based on the higher-resolution image; defining a repair toolpath for the defect based on the virtual model; navigating a sanding head over the workpiece according to the repair toolpath to repair the defect; and, during a processing cycle: navigating the sanding head across the workpiece according to the nominal toolpath and deviating the sanding head from the nominal toolpath to maintain forces of the sanding head on the workpiece proximal the nominal target force.


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