The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

Jul. 31, 2019
Applicant:

Cnh Industrial America Llc, New Holland, PA (US);

Inventors:

Luca Ferrari, Formigine, IT;

Christopher Barrick, Morton, IL (US);

Assignee:

CNH Industrial America LLC, New Holland, PA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A01B 79/00 (2006.01); A01B 69/00 (2006.01); B64C 39/02 (2023.01); B64U 101/30 (2023.01); G05D 1/00 (2006.01); G05D 1/02 (2020.01); G06T 7/11 (2017.01); G06V 20/10 (2022.01);
U.S. Cl.
CPC ...
A01B 79/005 (2013.01); A01B 69/001 (2013.01); A01B 69/004 (2013.01); B64C 39/024 (2013.01); G05D 1/0236 (2013.01); G06T 7/11 (2017.01); G06V 20/188 (2022.01); B64U 2101/30 (2023.01); G05D 2201/0201 (2013.01);
Abstract

A method for determining residue coverage within a field after a harvesting operation may include receiving yield data associated with an estimated crop yield across a field and generating an estimated residue coverage map for the field based at least in part on the yield data. The method may further include receiving residue data associated with residue coverage across a surface of the field following the performance of a harvesting operation within the field. Additionally, the method may include generating an updated residue coverage map for the field based at least in part on the estimated residue coverage map and the residue data.


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