The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2024

Filed:

Oct. 16, 2020
Applicant:

Meta Platforms Technologies, Llc, Menlo Park, CA (US);

Inventors:

Tsung-Hsun Tsai, Redmond, WA (US);

Lu Jie, Redmond, WA (US);

Xinqiao Liu, Medina, WA (US);

Assignee:

Meta Platforms Technologies, LLC, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 25/59 (2023.01); H04N 25/60 (2023.01);
U.S. Cl.
CPC ...
H04N 25/59 (2023.01); H04N 25/60 (2023.01);
Abstract

In one example, an apparatus comprises: a photodiode configured to generate a charge in response to light within an exposure period, a charge sensing unit configured to accumulate at least a part of the charge as an overflow charge, a quantizer, and a controller configured to: within a first time within the exposure period, control the quantizer to perform a first quantization operation to quantize the overflow charge accumulated at the charge sensing unit to generate a first measurement output; within a second time after the first time, and within the exposure period, control the quantizer to perform a second quantization operation to quantize the overflow charge accumulated at the charge sensing unit to generate a second measurement output; and generate a digital output to represent an intensity of the light based on at least one of the first measurement output or the second measurement output.


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