The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2024
Filed:
Aug. 09, 2021
Raytheon Company, Tewksbury, MA (US);
Andrew M. Wilds, Sahuarita, AZ (US);
Craig O. Shott, Benson, AZ (US);
Thomas Sanderson, Sahuarita, AZ (US);
Raytheon Company, Tewksbury, MA (US);
Abstract
An EO/IR optical imaging system comprises collection optics to collect light from a scene into a collimated or near-collimated space. An imaging detector is positioned at the image plane and configured to integrate incident light (radiant flux or photons) over an image frame and readout a sequence of pixelated images at a frame rate, said detector exhibiting a saturation threshold. To prevent saturation of the imaging detector, a MEMS MMA is positioned in the collimated or near-collimated space. A secondary detector (via a pick-off) samples light from the collimated or near-collimated space multiple times per image frame. A controller responsive to the sampled light commands a percentage of the mirrors to re-direct light incident on those mirrors to a light dump and commands the remaining mirrors to re-direct light incident on those mirrors to the imaging detector. Together the mirrors adjust a fraction of light reaching the imaging detector such that the integrated incident light for a given image frame is less than the saturation threshold.