The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2024

Filed:

Jul. 12, 2021
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Yoshihiro Seto, Kanagawa, JP;

Haruyasu Nakatsugawa, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 30/148 (2022.01); G06V 20/62 (2022.01); G06V 30/32 (2022.01);
U.S. Cl.
CPC ...
G06V 30/148 (2022.01); G06V 20/62 (2022.01); G06V 30/36 (2022.01);
Abstract

A management system including at least one processor, wherein the processor is configured to acquire an image obtained by imaging an outer surface of each of plural sample containers which contains a sample and in which name information of a subject from whom the sample is collected and subject discrimination information for discriminating plural subjects having the same surname and the same name are given to the outer surface, recognize the name information and the subject discrimination information given to each of the sample containers based on the image, and associate a test result related to the sample contained in each of the sample containers with a test order including the name information and the subject discrimination information, based on a result of the recognition and the test order.


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