The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2024

Filed:

Sep. 28, 2021
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Marcel Beister, Erlangen, DE;

Ludwig Ritschl, Buttenheim, DE;

Steffen Kappler, Effeltrich, DE;

Mathias Hoernig, Moehrendorf, DE;

Assignee:

SIEMENS HEALTHINEERS AG, Forchheim, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); A61B 6/00 (2006.01); A61B 6/02 (2006.01); G06T 5/20 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/008 (2013.01); A61B 6/025 (2013.01); A61B 6/502 (2013.01); A61B 6/5223 (2013.01); A61B 6/5235 (2013.01); G06T 5/20 (2013.01); G06T 2207/10112 (2013.01); G06T 2207/30068 (2013.01);
Abstract

A method for generating result slice images with at least partially different slice thickness based on a tomosynthesis image data set of a breast includes generating average value slices and maximum value slices (MIP) based on the tomosynthesis image data set, frequency dividing the average value slices into low-pass filtered and high-pass filtered average value slices, high-pass filtering of maximum value slices to form high-pass filtered maximum value slices, mixing high-pass filtered maximum value slices and high-pass filtered average value slices to form mixed high-pass filtered maximum value slices, combining the low-pass filtered average value slices with the mixed high-pass filtered maximum value slices to form the result slice images, and applying a moving maximum value across a selected thickness of maximum value slices or across a selected thickness of mixed high-pass filtered maximum value slices.


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