The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2024
Filed:
May. 19, 2021
Fujifilm Corporation, Tokyo, JP;
Shuhei Horita, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
A structure repair method selection system includes a repair evaluation unit that obtains an evaluation score for a structure after repair, a database that has data of a captured image of the structure and the evaluation score, an image acquisition unit that acquires a captured image of a target structure to be repaired, a damage detection unit that detects damage from the captured image, a similar damage extraction unit that extracts similar damage similar to the damage by using the database, and a repair method presentation unit that presents, based on the evaluation score, repair methods used for the similar damage. Also provided are a repair method selection method that uses the structure repair method selection system, and a repair method selection server.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile