The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2024

Filed:

Nov. 08, 2019
Applicant:

Dell Products L. P., Round Rock, TX (US);

Inventors:

Shubham Gupta, Jaipur, IN;

Hung The Dinh, Austin, TX (US);

Sabu Syed, Austin, TX (US);

Ramu Kannappan, Frisco, TX (US);

Jatin Kamlesh Thakkar, Bangalore, IN;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06F 40/284 (2020.01); G06N 3/044 (2023.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06F 40/284 (2020.01); G06N 3/044 (2023.01);
Abstract

In some examples, a computing device may implement a method that includes receiving microservice profile information at a microservice profiler, performing lexical analysis of the microservice profile information (where the lexical analysis produces tokenized information), generating microservice modification information by performing machine learning analysis of one or more inputs (where the one or more inputs comprise the tokenized information), and outputting the microservice modification information from the microservice profiler. The microservice profile information describes one or more characteristics of a microservice. The lexical analysis is performed by a lexical analysis engine of the microservice profiler, and the machine learning analysis is performed by a machine learning system of the microservice profiler.


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