The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2024
Filed:
Jul. 12, 2021
Splunk Inc., San Francisco, CA (US);
Ai-Chi Lu, San Francisco, CA (US);
Arun Ramani, Bellevue, WA (US);
Nicholas Matthew Tankersley, Seattle, CA (US);
Splunk Inc., San Francisco, CA (US);
Abstract
Data intake and query system (DIQS) instances supporting applications including lower-tier, focused, work group oriented applications, are tailored to display the metrics for the needs of the user. An interface caused by operation of an entity monitoring system (EMS) operating in conjunction with the lower-tier DIQS displays the monitored entities as individual representations. The user selects a metric and a metric threshold. The EMS causes a display of an interface having a representation for each monitored entity. Each representation includes a metric value and indicates an entity status based on the metric value and the threshold. The user can dynamically change the threshold on the interface for easy visualization of aggregation of monitored entities to determine the performance of the infrastructure. The interface also provides the user with the ability to select an entity and click through to the entity analysis workspace for more detailed information.