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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11934271 B1

PDFFull Text
Date of Patent:
Mar. 19, 2024

Filed:

Dec. 29, 2021

Memory system and operating method thereof

Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventors:

Nam Oh Hwang, Seoul, KR;

Yong-Tae Kim, Gyeonggi-do, KR;

Soong-Sun Shin, Gyeonggi-do, KR;

Duck-Hoi Koo, Gyeonggi-do, KR;

Assignee:

SK hynix Inc., Gyeonggi-do, KR;

Attorney:

IP & T GROUP LLP

Primary Examiner:

Huan Hoang

Int. Cl.
CPC ...
G11C 29/42 (2006.01); G06F 11/10 (2006.01); G06F 11/14 (2006.01); G11B 20/10 (2006.01); G11C 16/26 (2006.01); G11C 16/34 (2006.01); G11B 20/18 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1402 (2013.01); G06F 11/102 (2013.01); G06F 11/1048 (2013.01); G06F 11/141 (2013.01); G11B 20/10388 (2013.01); G11C 16/26 (2013.01); G11C 16/3431 (2013.01); G11B 2020/183 (2013.01);
Abstract

There are provided a memory system and an operating method thereof. A memory system includes: a plurality of storage regions, each including a plurality of memory cells; and a controller configured to provide a plurality of read retry sets, determine an applying order of the plurality of read retry sets based on characteristics of a read error occurred in a first storage region among the plurality of storage regions, and apply at least one of the read retry sets, based on the applying order, for a read retry operation performed on the first storage region.

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