The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2024
Filed:
Mar. 16, 2021
Nok Corporation, Tokyo, JP;
Kosuke Oura, Kanagawa, JP;
Atsushi Ikeda, Kanagawa, JP;
Satoshi Fukuoka, Kanagawa, JP;
Kenji Sasaki, Kanagawa, JP;
NOK CORPORATION, Tokyo, JP;
Abstract
A developing roll has a metal core, an elastic layer, and a surface layer. A value X is 65.6 N/mmor more and a value Y is 229 μm or more. The value X is P/(D×A)−P/(D×A). Pis the load to displace the roll 100 μm when a metal probe is pressed against the roll. Dis the displacement of the roll caused by the probe under the load P. A is the area of the probe. Pis the load to displace a material roll by 100 μm when the probe presses against the material roll with the core and the elastic layer and without the surface layer. Dis the displacement of the material roll caused by the probe under the load P. The value Y is the displacement of the roll when the probe pierces the surface layer.