The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2024
Filed:
Dec. 12, 2019
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Werner Wittke, Braunfels, DE;
Patric Pelzer, Wetzlar, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A microscope system includes: at least one microscope component with electrically adjustable component parameters; a controller for generating electrical signals and transmitting the electrical signals to the at least one microscope component to set the electrically adjustable component parameters; and a computer having at least one display unit, the computer generating an input unit having a graphical user interface on the at least one display unit, at least three setting parameters being adjustable by the graphical user interface. The input unit has an input pointer that is positionable in an input area so as to set a respective value for the at least three setting parameters. A coordinate axis is defined in the input area for each of the at least three setting parameters, with at least one coordinate axis not being perpendicular to another coordinate axis. Values of the at least three setting parameters are determined by the coordinates.