The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2024
Filed:
Apr. 26, 2021
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Martin Kubek, Driedorf, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
The invention relates to a microscope for microscopic examination of a sample comprising a microscope housing enclosing an illumination optics, a microscope stage and an imaging optics, an integrated sample chamber located within the microscope housing and formed by a separated housing section within the microscope housing. The housing section has a lid which provides direct access to the microscope stage for placing the sample in the sample chamber. The housing section has an interface for connection of an external incubation environment conditioning unit to the sample chamber. The interface is configured to provide a connection between the external incubation environment conditioning unit and the sample chamber, such that the environmental conditions in the sample chamber can be controlled when the external incubation environment conditioning unit is connected to the interface.