The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2024

Filed:

Oct. 14, 2021
Applicants:

Seoul National University R&db Foundation, Seoul, KR;

Graphene Square Inc., Suwon-si, KR;

Dankook University Cheonan Campus Industry Academic Cooperation Foundation, Cheonan-si, KR;

Inventors:

Byung Hee Hong, Suwon-si, KR;

Dong Jin Kim, Suwon-si, KR;

Yun Sung Woo, Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0028 (2013.01); G02B 21/006 (2013.01); G02B 21/008 (2013.01);
Abstract

A method of evaluating quality of graphene using a confocal laser scanning microscope, the method comprising steps of: irradiating with laser light a graphene layer formed on a catalyst layer; detecting a signal of light reflected from the graphene layer; forming a planar image of the graphene layer using the detected optical signal; and analyzing a contrast between graphene and the catalyst layer in the planar image, wherein the graphene layer is continuously formed on the catalyst layer by a roll-to-roll process.


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