The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2024

Filed:

Mar. 14, 2022
Applicant:

Asahi Kasei Microdevices Corporation, Tokyo, JP;

Inventor:

Kazuyuki Iguchi, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/38 (2006.01);
U.S. Cl.
CPC ...
G01V 3/38 (2013.01);
Abstract

Provided is an event detection method comprising: obtaining an event occurrence position based on a magnetic field detected by a magnetic sensor; selecting a detection axis for event detection based on the event occurrence position; calculating a trigger threshold value according to the event occurrence position on the detection axis; and obtaining a trigger signal indicating that the magnetic field detected by the magnetic sensor and the trigger threshold value meet a predefined condition.


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