The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2024
Filed:
Aug. 28, 2019
Erasmus University Medical Center Rotterdam, Rotterdam, NL;
Gyula Kotek, Dordrecht, NL;
Juan Antonio Hernández Tamames, Rotterdam, NL;
Erasmus University Medical Center Rotterdam, Rotterdam, NL;
Abstract
A method for magnetic resonance imaging (MRI) comprises applying a consecutive series of MRI sequences to a target volume (V) according to experimental settings (TR, α, β). A discrete sequence of transient response signals (Sn, Sn+1, Sn+2) is measured and fitted to a fit function (F) that is continuously dependent on a sequence number (n) of the respective MRI sequence (Pn) and corresponding response signal (Sn). A shape of the fit function is determined according to an analytically modelled evolution by the experimental parameters (TR, α, β) as well as variable intrinsic parameters (r, λ3, φ, δ) to be fitted. For example, the model is based on an equivalent harmonic oscillator. The intrinsic parameters of the fit function can be related to the intrinsic properties (PD, T1, T2) of the spin systems and used for imaging the target volume (V). Various optimizations of contrast can be achieved by tuning the experimental settings according to the model.