The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2024

Filed:

Feb. 18, 2021
Applicants:

Sumida Corporation, Tokyo, JP;

Kyoto University, Kyoto, JP;

Inventors:

Yoshiharu Yoshii, Natori, JP;

Masateru Hashimoto, Komoto, JP;

Tsutomu Ootsuka, Natori, JP;

Shingo Hamada, Natori, JP;

Yuki Takemura, Kyoto, JP;

Kan Hayashi, Kyoto, JP;

Norikazu Mizuochi, Kyoto, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/24 (2006.01);
U.S. Cl.
CPC ...
G01R 33/24 (2013.01);
Abstract

A magnetic resonance memberincludes a crystal structure and is capable of electron spin quantum operations with microwaves of different frequencies corresponding to arrangement orientations of a vacancy and an impurity in a crystal lattice. A magnetic field transmission unitsenses a measurement target magnetic field at plural measurement positions different from each other, and applies application magnetic fields corresponding to the measurement target magnetic field sensed at the plural measurement positions to the magnetic resonance memberalong respective different directions corresponding to the aforementioned arrangement orientations. A measurement control unitcontrols a high frequency power supply, and determines detection values detected by a detecting device (an irradiating deviceand a light receiving device) of the physical phenomena corresponding to the plural measurement positions. A calculation unitcalculates the measurement target magnetic field at the plural measurement positions on the basis of the detection values.


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