The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2024

Filed:

May. 18, 2023
Applicant:

Trustees of Boston University, Boston, MA (US);

Inventors:

Joshua Javor, Cambridge, MA (US);

David Bishop, Brookline, MA (US);

David Campbell, Brookline, MA (US);

Matthias Imboden, St. Blaise, CH;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/022 (2006.01); G01R 33/00 (2006.01); G01R 33/038 (2006.01);
U.S. Cl.
CPC ...
G01R 33/022 (2013.01); G01R 33/0052 (2013.01); G01R 33/038 (2013.01); G01R 33/0385 (2013.01);
Abstract

A system and method of effectively measuring a change in a gradient of a magnetic field. The systems include a first magnet and a second magnet mechanically coupled together and aligned along a polarization axis. The first magnet and the second magnet are positioned such that a pair of like magnetic poles of the first magnet and the second magnet face in opposite directions. Further, the first magnet and the second magnet are configured to move along the polarization axis in response to a magnetic field. A sensing system is configured to measure a change in a gradient of the magnetic field based on the movement of the first magnet and second magnet along the polarization axis in response to the magnetic field.


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