The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2024
Filed:
Sep. 18, 2019
Sysmex Corporation, Kobe, JP;
Kazuma Moriura, Kobe, JP;
Hiroshi Kurono, Kobe, JP;
SYSMEX CORPORATION, Hyogo, JP;
Abstract
Disclosed is a calibration curve creation method performed by an analyzer, the calibration curve creation method including: preparing a plurality of calibrators at different dilution rates by dispensing a calibrator in a container into one or more different containers; obtaining a plurality of measurement values by measuring each of the prepared plurality of calibrators; creating a calibration curve by use of the plurality of measurement values; selecting a first measurement value to be re-measured, among the plurality of measurement values used for the calibration curve; preparing another calibrator at a dilution rate corresponding to a calibrator from which the selected first measurement value is obtained; obtaining a second measurement value by measuring the prepared another calibrator; and creating a new calibration curve by replacing the first measurement value, among the plurality of measurement values, with the second measurement value.