The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2024
Filed:
May. 20, 2022
Sysmex Corporation, Kobe, JP;
SYSMEX CORPORATION, Hyogo, JP;
Abstract
Provided are a quality control method, a quality control system, a management apparatus, an analyzer, and a quality control abnormality determination method in which measurement results of both a quality control substance and a specimen are sufficiently utilized to improve the quality of quality control. The quality control method used in a management apparatus which is connected via a network to an analyzer installed in each of a plurality of facilities includes obtaining, from an analyzer in each facility via a network, first quality control information obtained by measuring an artificially generated quality control substance, and second quality control information obtained by measuring a plurality of specimens by the analyzer in each facility; and outputting information concerning quality control of an analyzer in at least one facility, based on the obtained first quality control information and second quality control information.