The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2024
Filed:
Jan. 30, 2020
The European Union, Represented BY the European Commission, Brussels, BE;
Andrea Valsesia, Ranco, IT;
Grigore Rischitor, Brussels, BE;
Douglas Gilliland, Comabbio, IT;
Jessica Ponti, Travedona Monate, IT;
Francesco Fumagalli, Cassago in Brianza, IT;
Monica Quarato, Noci, IT;
Pascal Colpo, Angera, IT;
Isaac Ojea Jimenez, Munich, DE;
THE EUROPEAN UNION, REPRESENTED BY THE EUROPEAN COMMISSION, Brussels, BE;
Abstract
The present invention relates to a method for the detection of at least one nano or micro plastic particle comprised in a heterogeneous matrix material comprising the following steps: applying of at least one part of a heterogeneous matrix material comprising at least one nano or micro plastic particle onto at least a portion of a surface of a conductive support thereby forming a first layer onto said surface, irradiating of at least a portion of said first layer with at least one ion beam, thereby forming an irradiated layer, detecting of the at least one nano or micro plastic particle comprised in said irradiated layer by a detection method chosen from the group of Raman nanoscopic techniques, or infrared nanoscopic techniques, or charge dependent detection methods or combination thereof. The present invention allowed good detection of micro and nano plastic particles with high resolution and sensitivity.