The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2024
Filed:
Jun. 22, 2020
Applicant:
Essenlix Corporation, Monmouth Junction, NJ (US);
Inventors:
Stephen Y. Chou, Princeton, NJ (US);
Wei Ding, Princeton, NJ (US);
Ji Qi, Hillsborough, NJ (US);
Jun Tian, Belle Mead, NJ (US);
Wu Chou, Basking Ridge, NJ (US);
Hongbing Li, Skillman, NJ (US);
Assignee:
Essenlix Corporation, Monmouth Junction, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01); G01N 21/03 (2006.01);
U.S. Cl.
CPC ...
G01N 21/31 (2013.01); G01N 21/03 (2013.01); G01N 2021/0346 (2013.01); G01N 2021/3129 (2013.01);
Abstract
The disclosure provides an apparatus, a device, and methods for improving optical analysis of a thin layer of a sample between two plates, particularly for multiple wavelengths.