The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2024
Filed:
Feb. 14, 2020
Applicant:
Universitat DE València, Valencia, ES;
Inventors:
Manuel Martínez Corral, Valencia, ES;
Genaro Saavedra Tortosa, Valencia, ES;
Emilio Sánchez Ortiga, Valencia, ES;
Peter Török, Valencia, ES;
Assignee:
UNIVERSITAT DE VALÈNCIA, Valencia, ES;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G01J 9/00 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G01J 9/00 (2013.01); G02B 21/06 (2013.01); G02B 21/365 (2013.01);
Abstract
The present invention relates to a microscope for quantitative measurements of the wavefront, comprising: Other aspects of the invention relate to a method, a computer program and a product incorporating the same, adapted for the performance of the functions of the computational entity of the microscope, as well as to a module and a kit for a microscope.